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With growing data communications traffic, broadband

radio communication systems such as radio-LANs, are

being developed that employ various modulation formats.

For example, IMT-2000 and other mobile communication

systems already use multicarrier methods.

Broadband radio signals are already being used in the

RF band. To push this envelope for higher quality data

transmissions, researchers and developers are studying

higher frequency/broader band carriers. In this kind of

radio communications environment, new measuring

instruments are needed that are not only more efficient

than ever, but also more flexible to support new

test requirements and communication standards.

The R3671 and R3681 are one of these new measuring

instruments for this new era of test and measurement

requirements. The R3671 and R3681 are high performance

signal analyzers. Employing our unique RF technology,

the R3671 and R3681 achieve an Average

Display Noise Level of –158 dBm*1), a Third-Order

Intercept Point (TOI) specification of +26 dBm*2), and a

signal purity of –122 dBc/Hz*3) to enable measurements

over a wide dynamic range.

High Accuracy Measurements

Use of a He-Ne laser for the reference wavelength enables high

accuracy measurements of up to 2 ppm. In addition, since the

He-Ne laser oscillates with high stability, a 2 ppm measurement

accuracy is guaranteed over a long time period without recalibration.

Wide Bandwidth

The measurement range covers short wavelengths of 480 to

1000 nm and long wavelengths of 1000 to 1650 nm and is

selectable via a single switch operation.

High-speed Sampling

The Q8326 can measure wavelengths at a sampling speed of

five per second so that wavelength fluctuations caused by temperature

variations can be captured precisely.

Frequency and Deviation Displays

The Q8326 can not only display the wavelength but can also

be switched to display the frequency of the beam under measurement,

which is convenient for adjusting the oscillation

wavelength to the ITU-T grid. Since the deviation is displayed

using the keyed entry as the reference, wavelength fluctuations

of the LD caused by temperature variations can be viewed with

high resolution and high precision.

GPIB Provided as Standard

Standard provision of GPIB allows the Q8326 to be used as a

component for an automated measuring system utilizing fast sampling.

Applications

•Optimum for LD wavelength adjustment for DWDM due to

fast sampling measurement.

•Can be used as a wavelength standard for spectroscope calibration

due to high accuracy.

•Can be automated to measure the LD wavelength temperature

characteristics and wavelength current characteristics.

High Resolution

The Michelson interference method allows high resolution

measurements of up to 0.001 nm/100 MHz.

High Accuracy Measurements

Use of a He-Ne laser for the reference wavelength enables high

accuracy measurements of up to 2 ppm. In addition, since the

He-Ne laser oscillates with high stability, a 2 ppm measurement

accuracy is guaranteed over a long time period without recalibration.

Wide Bandwidth

The measurement range covers short wavelengths of 480 to

1000 nm and long wavelengths of 1000 to 1650 nm and is

selectable via a single switch operation.

Measures Optical Wavelength with High Accuracy of 2 ppm

and High Resolution of 0.001 nm.

● Fast sampling: Five measurements/sec.

● Frequency and deviation displays

Wavelength Meter Using He-Ne Laser as Reference Wavelength

The Q8326 is an optical wavelength meter that

measures an emission center wavelength with high resolution.

The Q8326 uses a He-Ne laser for the reference

wavelength and uses the Michelson interference

method to enable high accuracy measurement.

This wavelength meter achieves

fast sampling (five per second) which is optimum

for oscillation wavelength adjustment of

LD for DWDM. With the deviation display

function, wavelength fluctuations can also be

measured with high resolution and accuracy.

For Characteristic Test for Transistor and FET

Synchronized operation

of the two units of the

6243/6244 allows characteristic

test of a transistor or FET. Id and Ig can be

measured simultaneously,

as controlling the source

timings of drain voltage

and gate voltage to protect

a device from stress.

● Linear, log and random

sweep functions

● Pulse measurement with

a minimum pulse of 1ms

● Me a s u r eme n t d e l a y

function for measurement timing control

● Source delay function

for source timing control

For Battery Charge/Discharge Test

The 6243/6244 is available for battery charge and discharge test at constant

current (CC) or constant voltage (CV) by DC or pulse application.

In a pulse charge and discharge test, measurement must be done at

the time of and after the pulse application.

Using two units will allow measurement at the two points above and

increase the current capacity up to 20A.

● Source sink current up to ±20A (7V)

● 20A (6244) and 4A (6243) by two-unit parallel operation

● Measurement at pulse HI/LO points

● Selectable from voltage measurement or current measurement

DC voltage/current source monitor ideal for

electronic circuit/component evaluation

by flexible source and measurement

l Wide ranging source/measurement

6243 Voltage: 0 to ±110V Current: 0 to ±2A

6244 Voltage: 0 to ±20V Current: 0 to ±10A

l 5½-digit display with 1μV/100pA (6243), 1μV/1nA (6244)

resolution in measurement

l Pulse measurement with a minimum pulse width of 1ms

l Sink-enabled bipolar output

The 6243/6244 is a DC voltage and current source/monitor

that offers wide ranging source and measurement as follows:

6243 Voltage: 0 to ±110V Current: 0 to ±2A

6244 Voltage: 0 to ±20V Current: 0 to ±10A

The 6243/6244 provides high accuracy with 4½-digit

source resolution and 5½-digit measurement resolution, a

variety of sweep functions, and a pulse measuring function

with a minimum pulse width of 1ms. Thus, it can be

used for a wide range of applications as a power source for

evaluation in research and development of semiconductors

and other electronic components or for characteristic test

systems in a production line.