Best-In-Class Parallel Test Efficiency – Multi-Site Controller

As more DUTs (Devices Under Test) are measured simultaneously, overhead tends to increase,

and test times in general tend to be longer. However, the T2000 reduces test time and achieves

high throughput with highly efficient multi-site test technology that completely eliminates overhead.

Test Time Reduction – Concurrent Test

The T2000 supports concurrent test functionality which can execute complex device test in shorter

times. Concurrent test can be more easily achieved than in the past, as the T2000 can seamlessly

switch between sequential execution and parallel execution of multiple test items. In addition,

its concurrent test functionality enables users to rapidly develop test programs with short test times.

Test Cost Reduction

With up to 8.192 digital channels, the T2000 achieves more than twice the parallelism of the previous

model, reducing test cost.

Software

• Windows-based operating system.

• Rapid Development Kit (RDK) environment: allows easy coding, high code reusability, and fast and easy

debugging.

• Versatile offline environment: T2000 System Software Emulator.

• Intuitive debug tools: Wave Tool (Logic Analyzer, Oscilloscope), Shmoo, Pattern Editor, Block Diagram

Tool, etc.

• Reduces time to market: Test Condition Runtime Optimizer, Multi-session

Test Cost Reduction

With up to 8.192 digital channels, the T2000 achieves more than twice the parallelism of the previous

model, reducing test cost.

Software

• Windows-based operating system.

• Rapid Development Kit (RDK) environment: allows easy coding, high code reusability, and fast and easy debugging.

• Versatile offline environment: T2000 System Software Emulator.

• Intuitive debug tools: Wave Tool (Logic Analyzer, Oscilloscope), Shmoo, Pattern Editor, Block Diagram Tool, etc.

• Reduces time to market: Test Condition Runtime Optimizer, Multi-session

SoC Test Solution

High-performance, low-cost SoC test solution optimized for high-volume manufacturing of today’s complex consumer devices.

Achieve feature-rich capabilities with high precision

In the ever-evolving digital consumer market, devices are becoming more sophisticated and diversified

in terms of functionality with:

• Multi-Time Domain functionality for testing several frequency domains simultaneously.

• 1.6GDME realizes low cost of test by high parallel testing.

• DSP192A module supports 96-ch device power supply by high density mounting.

• Analog module (GPWGD) full-spec test, covering high-performance audio to video.

• PMU32E module capable of handling a broad spectrum of precision test including ADC/DAC linearity.

• 8GDM corresponds to high-speed interface device testing.

Flexibly combined with these test modules, T2000 provides customers with an optimized test solution for

consumer devices.

Features

While chipmakers enhance the functionality of semiconductor devices and increase

multi-functionality, they need to reduce development times.

Advantest’s T2000 is ideal for testing these devices.

Time to Market Reduction – Multi-Session

The T2000 makes it possible to develop device test programs efficiently with minimal investment.

 With the multi-site CPU architecture unique to the T2000. multiple users can log in to a single

test system at the same time, and perform debugging work independently. Up to eight people

can work simultaneously, contributing to both engineering cost savings and TTM reduction.

In addition, eight people can develop separate functions for the same device concurrently,

which greatly shortens development times.

Best-In-Class Parallel Test Efficiency – Multi-Site Controller

As more DUTs (Devices Under Test) are measured simultaneously, overhead tends to increase,

and test times in general tend to be longer. However, the T2000 reduces test time and achieves

high throughput with highly efficient multi-site test technology that completely eliminates overhead.

Test Time Reduction – Concurrent Test

The T2000 supports concurrent test functionality which can execute complex device test in shorter

times. Concurrent test can be more easily achieved than in the past, as the T2000 can seamlessly

switch between sequential execution and parallel execution of multiple test items. In addition,

its concurrent test functionality enables users to rapidly develop test programs with short test times.

Test Cost Reduction

With up to 8.192 digital channels, the T2000 achieves more than twice the parallelism of the previous

model, reducing test cost.

Overview

Flexible Platform Addresses Diverse Test Needs

SoC devices require small-lot high-mix manufacturing methods in the present

era of rapid generation change. Semiconductor manufacturers struggle with

requirements to reconfigure a test system in a short time.

The T2000 platform adopts a module architecture and can be flexibly reconfigured

by rearranging the necessary functional modules according to the application.

A rich variety of functional modules, including digital, high-performance analog,

power-mixed signals, and image capture, provide a wide range of test coverage

and offer solutions at optimal cost. This makes it possible to have a scalable 

system configuration ranging from an air cooling system with 13 slots to a liquid

cooling system with 52 slots and up to 8.192 channels.

Advantest provides compact solutions with reduced initial investment for development

and small lot productions, and high-efficiency multiple-DUT parallel measurement

solutions for high volume manufacturing. The T2000 responds quickly to market

needs with minimal capital investment.

DC Voltage/Current Generators/Calibrators

For Evaluating and Calibrating Precision Instruments and Circuits R6144 

Programmable DC Voltage/Current Generators

■ Large Capacity of Up To 32 V/160 mA

■ High Accuracy (0.03%), High Stability

■ Low Noise (3 mVp-p)

■ 50 ms Settling Time

The R6144 is precision voltage and current generators ideal for

evaluation of precision circuits and parts as well as calibration

of temperature controllers.

The units use a time-sharing D/A conversion circuit which

provides excellent linearity and stability. Settling time and

output noise are greatly reduced for higher reliability, allowing

construction of a high throughput measurement system.

GPIB and BCD parallel interfaces are provided as standard

features, enabling compatibility with a wide range of host

devices such as personal computers, sequencers or general

purpose I/O interfaces.

■ Up to 32 V/160 mA Voltage, Current Output

■ High Resolution (1 µV/100 nA steps)

■ High Accuracy Guaranteed For 6 Months: 0.03%

(Voltage), 0.035% (Current)

■ Low Noise Increases Measurement Reliability: 3

mVp-p, One-Fifth of Previous Models’ Noise Level

■ Reduced Settling Time Enables Improvements In

Throughput: 50 ms, One-Third of Previous Models’

Time

■ Built-In 160-Step Memory

■ All-Digit Continuous Variable Sweep Function

Enables Wider Range of Measurement Applications

■ Programs Written For Previous Model (TR6142)

Can Be Used Without Modifications