D3286 Pulse Pattern Generator/Bit Error Detector

150 Mbps to 12.5 Gbps BER Performance Test System for SDH/SONET

D3286 Error Detector

SDH/SONET frame synchronization for system evaluation

Region-specific error detection for SDH frame and ATM cell measurements

Burst data measurement for loopback testing

Auto-search function to adjust the most suitable timing and voltages

Data and clock monitoring outputs

FD drive for storing measurement results and setup data

Graphical user interface (GUI) environment for an easy-to-understand operating environment

Ultra-high-speed digital telecommunication networks are being built to accommodate

the transmission of high-capacity information in the multimedia era of the future.

Extensive Analysis Functions

Sweep Function

The Q8384 displays the optical frequency on the horizontal axis; this is ideal for measuring

the grid frequencies of standardized wavelengths specified by the ITU-T (International

Telecommunication Union Telecommunication Standardization Sector).

Measuring the noise figure of a fiber-optic amplifier The Q8384 improves the noise figure

of a fiber-optic amplifier by enhancing the dynamic range, polarization correlation,

level accuracy, linearity, and accuracy of wavelength resolution settings.

As well as applying curve fitting and other features, the Q8384 realizes

high-precision noise figure measurements at the touch of a button.

Since the Q8384 can accurately determine the ASE signal level of DWDM signals

that are multiplexed at 10-minute intervals.

Since the Q8384 can accurately determine the ASE signal level of DWDM signals

multiplexed at intervals of 50 GHz (0.4 nm) or narrower, it not only performs accurate noise figure measurements,

but it can also accurately measure the noise figure of DWDM signals multiplexed at intervals of 10 minutes.

It not only performs accurate noise figure measurements,

but also displays multiple lists of measurement results at the same time.

WDM Analysis Functions

The Q8384 can display up to 256 wavelength peaks and power levels of WDM signals.

It displays the deviation of the wavelength and power level from the

ITU-T channel spacing or reference signal as well as the absolute value.

Alternate Scanning Function

The Q8384 can display two sets of measurements under different setup conditions in two windows.

These windows are always rewritable using the Q8384’s alternate scan feature.

With this feature, users can make detailed measurements of signals in a specific wavelength

band while monitoring the entire wavelength region of the WDM system.

Superior Fundamental Performance

10 pm High Wavelength Resolution The Q8384 achieves a wavelength resolution bandwidth

of up to 10 pm by using a newly developed monochromator system.

This makes it possible to measure and evaluate the sidebands of 10 Gbps intensity-modulated optical signals,

a task previously impossible with conventional spectrum analyzers.

20 pm high wavelength accuracy

Calibrated with the built-in calibration light source (option 25), the Q8384 achieves wavelength

 measurement accuracy of ±20 pm in the C-band wavelength range from 1530 to 1570 nm.

The Q8384 achieves wavelength measurement accuracy of ±20 pm in the

C-band wavelength range of 1530 to 1570 nm and ±40 pm in the L-band wavelength range of 1570 to 1610 nm.

It enables accurate characterization of laser diodes and filters used in DWDM transmission systems.

The Q8384 can also accurately measure the wavelength spacing of WDM signals

because of its ±10 pm wavelength linearity over the 1530 to 1570 nm wavelength range.

50 dB (±0.1 nm)/60 dB (±0.2 nm) Wide Dynamic Range

In DWDM systems, signals need to be WDMed at intervals of 50 GHz (0.4 nm) or less.

Separating and measuring these closely spaced signals requires an optical spectrum analyzer with excellent dynamic range.

The Q8384’s dynamic range of 60 dB or more at 0.2 nm makes it ideal for this task.

With a dynamic range of 50 dB or more at 0.1 nm, the instrument can support future DWDM systems with closer signal spacing.

+23 dBm (200 mW) high-power direct input The Q8384 can directly measure high-power

signals from fiber amplifiers or pump laser diodes without attenuation.

DWDM optical communication systems also contain WDM channels spaced close to 50 GHz (0.4 nm).

In this environment, an optical spectrum analyzer with excellent dynamic range

is required to separate the optical signal and measure the noise figure (NF) of the optical amplifier.

With a dynamic range of 50 dB at 0.1 nm and 60 dB at 0.2 nm,

the Q8384 fully meets these requirements.

The instrument is equipped with an automatic optical amplifier NF measurement and calculation function,

allowing the user to perform the measurement in a simple manner.

The Q8384 can be optionally equipped with a built-in reference wavelength light source and an EE-LED (Edge Light Emitting Diode).

When calibrated with this reference light source,

the instrument ensures wavelength accuracy of 20 pm in the 1550 nm band.

Utilizing the EE-LED’s broadband light source, the Q8384 allows the user to easily measure

and evaluate the transmission and loss characteristics of narrowband filters.

The Q8384 Optical Spectrum Analyzer measures and evaluates ultra-high-speed optical

DWDM transmission systems and optical components with high wavelength resolution and high accuracy.

The new high-end optical spectrum analyzer utilizes a new four-pass monochromator system

to provide high wavelength resolution and wide dynamic range.

● 10 pm resolution bandwidth

● 20 pm wavelength accuracy (using Opt.)

● Wide dynamic range: 50 dB (±0.1 nm), 60 dB (±0.2 nm)

● Optical frequency display

● Accurate NF measurement of EDFAs

● Handles power levels up to +23 dBm (200 mW)

● Rich WDM analysis functions

● Provides limit line function for pass/fail analysis

In DWDM optical communications, accurate wavelength measurements of light sources are required.

Evaluating these specifications requires optical spectrum analyzers with

higher resolution bandwidth and wavelength accuracy.

To meet these stringent requirements, the Q8384 has the world’s highest

wavelength resolution of 10 pm* and wavelength accuracy of 20 pm.

It also achieves 20 pm wavelength accuracy in the 1550 nm band.

This high performance enables the Q8384 to accurately measure the oscillating wavelength characteristics of laser diodes.

DWDM optical communication systems also include wavelength division multiplexing channels.

Wavelength measurement accuracy of ± 0.1 nm

Measurements are accurate to ± 0.1 nm (1.3 µm) using the built-in He-Ne laser as a reference light source.

As a result, accurate wavelength measurements can be made without wavelength calibration.

Maximum wavelength range of 0.05 nm

The Q8344A has a maximum resolution of 0.05 nm at short wavelengths (0.85 µm),

making it possible to measure CD and visible laser diodes in fully resolved oscillation mode, one by one.

Large-diameter fiber input (option)

An optional 200 µm large aperture input is available.

This option is required when analyzing devices with wavelengths larger than the standard fiber aperture (GI 50 µm).

For laser diode analysis, the standard 50 µm size is recommended,

while for LED analysis, this optional size is recommended.

Coherent Measurements

Since the Q8344A uses a Michelson interferometer, it can be used for coherence measurements.

This feature makes it easy to evaluate the performance of noise suppression caused by

the return light of laser diodes in video disks.

An analysis range of approximately ±10 mm enables measurement of

the coherence length of SLDs (Super Light Emitting Diodes) used in fiber optic gyros.

High-speed measurement at 1.5 sec/scan

Ideal for production applications

The Q8344A utilizes a Fourier spectroscopy system so that measurements can be completed in less than 1.5 seconds,

regardless of the measurement span and sensitivity (provided that the starting wavelength is 0.4 µm

or longer and that the measurement does not cover both short and long wavelengths).

The analyzer is therefore suitable for measuring laser diodes and light emitting diodes on production lines.

In addition, it can be used to evaluate the transmission and loss characteristics of optical fibers and filters.

When used as a system component, the analyzer can be triggered, measured,

and output data in just 1.5 seconds, dramatically increasing system throughput.

Optical Measuring Instruments and Optical Device Test Systems

Optical Spectrum Analyzer for Coherent Measurements

■Coherence measurement

■High-speed measurements at 1.5 sec/scan

Wide wavelength range from 0.35 micron to 1.75 micron

■Wavelength measurement accuracy of 0.1 nm

The Q8344A is an optical spectrum analyzer with a wide wavelength range from 0.35 to 1.75 µm.

By using a Fourier spectroscopy system with a Michelson interferometer,

it is possible to analyze coherence that cannot be obtained with a dispersive spectroscopy system using a monochromator.

It demonstrates the ability to evaluate laser diodes for optical and video disks.

The Optical Measurement Instruments and Optical Devices Test System

has a built-in He-Ne laser used as a reference wavelength with a wavelength accuracy of ± 0.1 nm (1.3 µm),

which ensures long-term measurement stability even without wavelength calibration.

With a maximum wavelength resolution of 0.05 nm (0.85 µm), the Q8344A is suitable

for measuring laser diodes with narrow mode intervals.

Measurement speeds of about 1.5 seconds (0.4 to 1.05 µm and 0.8 to 1.75 µm)

are independent of the analysis span, so it can be used as a system component.

With its versatile display, analysis, and processing capabilities,

the Q8344A can be used for a variety of component characterization applications,

from light-emitting components such as laser diodes and LEDs to optical components such as optical fibers and filters.

High wavelength accuracy

Wavelength accuracy: ±0.01 nm (optional), ±0.05 nm (standard)

The Q8341’s built-in Ne-He laser reference light source enables spectral measurements with high wavelength accuracy.

Narrow-resolution measurement of the oscillation mode of a blue-violet laser diode

Wavelength resolution (at 650 nm):

0.01 nm (optional)

0.05 nm (standard)

The Q8341 has a narrow resolution that separates the oscillation modes of blue-violet laser diodes. In addition, the peak wavelength is measured with a resolution of 0.001 nm, making it ideal for monitoring measurement results affected by the DUT environment.

For high-throughput measurements

The Q8341 utilizes a large-capacity memory and a high-performance calculation unit to quickly store data. The calculation unit then performs calculations on this data to display the specified wavelength and span.

For example, if the Q8341 is to analyze spectra in two wavelength ranges (650 nm ±50 nm and 780 nm ±50 nm), it can perform spectral analysis of two different LDs by simply changing its display range.

All of this can be accomplished without reconfiguring the system. As a result, the Q8341 reduces the indexing time for mass production system use.

Measurement Principle

The Q8341 utilizes a Michelson interferometer. In this arrangement, light from the device under test is split into two paths (interference is generated between the two paths).

This produces an interferogram. The horizontal axis represents the difference in length (i.e., time or phase) of the two optical paths. And the vertical axis represents the intensity of the interfering light.

This is the autocorrelation of the device under test. FFT processing of this function yields the power spectrum. For this purpose, a He-Ne laser is used as a wavelength reference source.

Features

High-speed measurement option: 0.5 s.

Ideal for manufacturing/production environments The Q8341 can measure an entire span in approximately 0.5 seconds. This feature makes the Q8341 ideal for laser and LED production lines.

In addition, this fast measurement speed is ideal for high capacity environments.

Outstanding coherent analysis length

Analysis length Approx. 40 mm maximum (option)

Approx. 10 mm maximum (standard)

Maximum length resolution 0.001 mm

The Q8341 also evaluates the coherence of optical disk laser diodes. with an analysis length of up to 40 mm and a resolution as narrow as 0.001 mm, the Q8341 is ideally suited for evaluating blue-violet laser diodes and other compact optical components.