Measurement Principle

The Q8341 utilizes a Michelson interferometer. In this arrangement, light from the device under test is split into two paths (interference is generated between the two paths).

This produces an interferogram. The horizontal axis represents the difference in length (i.e., time or phase) of the two optical paths. And the vertical axis represents the intensity of the interfering light.

This is the autocorrelation of the device under test. FFT processing of this function yields the power spectrum. For this purpose, a He-Ne laser is used as a wavelength reference source.

Features

High-speed measurement option: 0.5 s.

Ideal for manufacturing/production environments The Q8341 can measure an entire span in approximately 0.5 seconds. This feature makes the Q8341 ideal for laser and LED production lines.

In addition, this fast measurement speed is ideal for high capacity environments.

Outstanding coherent analysis length

Analysis length Approx. 40 mm maximum (option)

Approx. 10 mm maximum (standard)

Maximum length resolution 0.001 mm

The Q8341 also evaluates the coherence of optical disk laser diodes. with an analysis length of up to 40 mm and a resolution as narrow as 0.001 mm, the Q8341 is ideally suited for evaluating blue-violet laser diodes and other compact optical components.