Category: Advantest

■ Synchronized 2-Channel Generation, Measurement

■ Measurement Resolution of 1 µV, 10 fA (SMU220-2), 100 pA (SMU62-20)

■ Source Range ±220 V, ±2 A (SMU220-2, 2.4 W)/±62 V, ±20 A (SMU62-20, 140 W)

■ Minimum Pulse Width 100 µs, Minimum Step 700 µs

R6245/6246 DC Voltage/Current Sources/Monitors

The R6245/6246 Series are DC voltage/current dcs-sis.com sources and monitors having source measurement units (SMUs) with 2 isolated channels. 

The series covers wide source and measurement ranges.

It is ideal for measurement of DC characteristics of items ranging from separate semiconductors such as bipolar transistors, 

MOSFETs and GaAsFETs, to ICs and power devices. 

Further, due to the increased measuring speed and synchronized 2-channel measurement function, 

device I/O characteristics can be measured with precise timing at high speed which previously difficult to accomplish.

Due to features such as the trigger link function and the sequence programming function which automatically performs a series of evaluation tests automatically, the new R6245/6246 enable much more efficient evaluation tests.

 ■ High Measurement Accuracy of ±620000 Columns, 0.02%

High Measurement Resolution of 1 mV, 10 fA 

 ■ High source Accuracy of ±62000 Columns, 0.03%

 Wide source Range of ±220 V, ±20 A

 ■ High Throughput, 0.8 V/µs (At Current Measurement Range of 6 mA or more)

 ■ Wide Variety of Measurement Functions

 • 4 Phenomenon Output (Source/Sink)

 • Up to 5 V Remote Sense

 • Minimum Step 700 µs Sweep Measurement (Generation, Measurement, Data Storage)

 • Range Switching without Discontinuous Output

 • Pulse Measurement with Minimum Pulse Width of 100 µs

 • Synchronized 2-Channel Measurement Function

 • Search measurement function

Description:

A spectrum analyzer is a broadband, very sensitive receiver.

It operates on the principle of a “super-aberrant receiver”, converting higher frequencies (usually ranging up to tens of gigahertz) into measurable quantities.

The received spectrum is slowly scanned through a series of pre-selected frequencies, which are converted to measurable DC levels (usually on a logarithmic scale) and displayed as such on the Advantest R3272’s CRT.

The CRT displays the received signal strength (y-axis) versus frequency (x-axis).

.Compact, Lightweight (16.5 kg) MicrowaveSpectrum Analyzer

.Wide Frequency Range: 9 kHz to 26.5 GHz

.Independent Function Keys Make OperationSimple

.High Stability Narrow Band Sweep Made PossibleBy DDS (Direct .Digital Synthesizer) Technology

.Newly-Developed High-Speed Settling SynthesizerGreatly Improves .Measurement Throughput

.Large, Easy-To-Read TFT Color LCD Display

.IC Memory Card, 2 SlotsJEIDA Ver. 4.2/PCMCIA 2.1

In the field of radio communication which supports the in-creasingly information oriented world,

the role played bymicrowave and quasi-millimetric waveband communicationis increasing year by year.

R3272 is a high-function portable spectrum analyzer whichcan be operated simply to do spectrum analysis of thesemicrowave and quasi-millimetric wavebands. 

It has a fre-quency range of 9 kHz to 26,5 GHz (or up to 60 GHz using anexternal mixer), an input range of +30 dBm to -120 dBm, 

anamplitude display with a dynamic range of 100 dB and aresolution bandwidth of 300 Hz.

A frequency counter with a 1Hz resolution is also provided.

The R3272 is an ideal spectrui analyzer for wave and spuriousmeasurements in microwave circuits and satellite communica-tion.

Description:

The Advantest D3186 is a high-performance pulse pattern generator that generates seven types of pseudo-random (PRBS) patterns from 27-1 to 231-1. programmable (WORD) patterns.

Programmable (WORD) patterns, up to 8M bits, or frame patterns for SDH or SONET structures, at speeds ranging from 150 Mb/s to 12 Gb/s.

In addition, by combining the D3186 with the D3286 BER detector, it is possible to build a system for evaluating the BER of ultra-high-speed optical communication devices and compound semiconductors.

With the D3186. you can choose a built-in high-precision synthesized clock generator. Sixteen types of frequency memories are provided for fast frequency setting.

For PRBS mode, the marker ratio can be changed between 8 values. Payload type can be selected from WORD, PRBS and CID for FRAME mode.

ALTERNATE mode is available and can be switched on 2 modes (WORD and FRAME) to perform measurements.

Various types of applications are available by using differential data output, differential clock output, and fixed amplitude clock output.

Amplitude, offset, and terminator conditions can be set for differential data output and differential clock output, respectively. The terminator condition can be selected from TO 0 V, TO -2 V, or AC coupling.

Starting from a motor-driven delay block, the phase of the clock output can be varied in 1 ps resolution steps up to ± 400 ps.

When using the D3186 in combination with the D3286 error detector for error measurement, the master-slave function interlocks their modes.

GPIB functionality allows full remote control, making it easy to dcs-sis.com build measurement and test systems. The built-in floppy disk drive can store/recall the contents of set conditions and mode settings.

Avoid using the D3186 in dusty areas or where the unit is exposed to direct sunlight or where corrosive gases are generated.Always use the D3186 in an area with an ambient temperature of 0 to 40 degrees Celsius and a relative humidity of 40% to 85%.

Avoid excessive mechanical shock to the D3186. Since the D3186 has an exhaust cooling fan, be sure to leave a space of 10 centimeters or more between the rear panel and the wall. Also avoid blocking the air inlet holes on both sides of the D3186.

Supply voltage should be 90 to 132 VAC or 198 to 250 VAC, 48 to 63 Hz. 100 V and 200 V power circuits switch automatically. Use a power supply with sufficient capacity since the unit consumes a maximum of 550 VA.

The Single Scalable Test Platform

In the age of IoT, 5G and artificial intelligence, more than half of all the microchips manufactured in the world are tested by our equipment. As the industry’s leading manufacturer of automated test systems for semiconductor devices, we continuously revolutionize market standards and enable customers to shape their digital future.

Our V93000 platform addresses the latest industry challenges and enables applications like Artificial Intelligence (AI) & High-Performance Compute (HPC), medical devices, Advanced Driver Assistance Systems (ADAS), making the world safer, faster and our lives easier.

Thanks to the platform’s scalability and compatibility over multiple generations, V93000 is future proof and saves cost. The all-in-one platform covers a variety of different solutions like RF, digital, power and analog.

Large Installed Base

Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high-volume manufacturing. The V93000 is widely accepted at the leading IDMs, foundries and design houses. Outsourced IDMs and fabless companies find the V93000’s test capacity installed in all major OSATs worldwide.

Advantages and Benefits

Platform scalability enables outstanding device portfolio coverage and provides CoT advantages in one single scalable test platform

The widest range of compatible tester configurations, that scale from small footprint engineering systems to very high pin count wafer sort and final test systems for high volume manufacturing (HVM),

The broadest application coverage in the industry, from High Performance Compute (HPC) & AI, to mobile & RF, to automotive & industrial.

Compatibility across tester generations maximizes test capacity utilization and investment protection of test hardware

Probe card and device-under-test (DUT) boards, and test programs can be utilized across V93000 generations to provide:

Fast qualification and transition to new capabilities

Flexibility to efficiently utilize available test capacity

Investment protection for test hardware (systems, instruments, dcs-sis.com probe cards and final test interface hardware) and test engineering infrastructure, knowledge and training

Integration technology leadership driving ATE Innovation through Moore’s Law

The innovative test processor-per-pin and environment friendly water-cooled architecture, which has endured over four generations of the V93000 is delivering industry leading pin density, reliability, and measurement stability & repeatability of digital, analog and RF instruments.

Providing superior solutions that are optimized for performance and throughput

The Cross Domain Analyzer U3800 Series is a vector and spectrum-signal analyzer with built-in two-channel RF input function. This is the industry’s first metrology tool that enables comparative measurement/analysis of the signals from two channels on the basis of their time, amplitude, phase, and frequency domains by simultaneous and synchronized measurement. 

This Cross Domain Analyzer has the following features and functions:

 ● Two-channel RF input and wide frequency range

 ● The best-in-class time domain analysis bandwidth of 40 MHz

 ● Vector operation that allows composition/decomposition

 U3800 Series allow the users to easily measure and analyze multiplexed/mixed/interfered signals so that complex signal analyses that are conven

tionally difficult to perform, such as multipath analysis, dcs-sis.com electromagnetic field decomposition, and inter-circuit interference, can be carried out. 

U3800 Series consists of analyzers applicable to a wide variety of fields such as broadcasting, telecommunication, and EMC.

A new field of RF measurement—Concept of Cross Domain

”We want to freely compare two RF signals in different analytical domains so that measurement and comparison of two signals that change with time, such as those in transient phenomena, modulating waves, and EMC noise can be achieved by means of a vector operation.” In order to satisfy such requirements, we have developed a measurement equipment that can easily measure, compare, and 

analyze true momentary signals, which is difficult in the case of conventional measurement equipments, by equipping it with a two-channel phase-locked loop vector measurement function and operation function.