Category: Advantest

The Q8384 Optical Spectrum Analyzer measures and evaluates ultra-high-speed optical

DWDM transmission systems and optical components with high wavelength resolution and high accuracy.

The new high-end optical spectrum analyzer utilizes a new four-pass monochromator system

to provide high wavelength resolution and wide dynamic range.

● 10 pm resolution bandwidth

● 20 pm wavelength accuracy (using Opt.)

● Wide dynamic range: 50 dB (±0.1 nm), 60 dB (±0.2 nm)

● Optical frequency display

● Accurate NF measurement of EDFAs

● Handles power levels up to +23 dBm (200 mW)

● Rich WDM analysis functions

● Provides limit line function for pass/fail analysis

In DWDM optical communications, accurate wavelength measurements of light sources are required.

Evaluating these specifications requires optical spectrum analyzers with

higher resolution bandwidth and wavelength accuracy.

To meet these stringent requirements, the Q8384 has the world’s highest

wavelength resolution of 10 pm* and wavelength accuracy of 20 pm.

It also achieves 20 pm wavelength accuracy in the 1550 nm band.

This high performance enables the Q8384 to accurately measure the oscillating wavelength characteristics of laser diodes.

DWDM optical communication systems also include wavelength division multiplexing channels.

Wavelength measurement accuracy of ± 0.1 nm

Measurements are accurate to ± 0.1 nm (1.3 µm) using the built-in He-Ne laser as a reference light source.

As a result, accurate wavelength measurements can be made without wavelength calibration.

Maximum wavelength range of 0.05 nm

The Q8344A has a maximum resolution of 0.05 nm at short wavelengths (0.85 µm),

making it possible to measure CD and visible laser diodes in fully resolved oscillation mode, one by one.

Large-diameter fiber input (option)

An optional 200 µm large aperture input is available.

This option is required when analyzing devices with wavelengths larger than the standard fiber aperture (GI 50 µm).

For laser diode analysis, the standard 50 µm size is recommended,

while for LED analysis, this optional size is recommended.

Coherent Measurements

Since the Q8344A uses a Michelson interferometer, it can be used for coherence measurements.

This feature makes it easy to evaluate the performance of noise suppression caused by

the return light of laser diodes in video disks.

An analysis range of approximately ±10 mm enables measurement of

the coherence length of SLDs (Super Light Emitting Diodes) used in fiber optic gyros.

High-speed measurement at 1.5 sec/scan

Ideal for production applications

The Q8344A utilizes a Fourier spectroscopy system so that measurements can be completed in less than 1.5 seconds,

regardless of the measurement span and sensitivity (provided that the starting wavelength is 0.4 µm

or longer and that the measurement does not cover both short and long wavelengths).

The analyzer is therefore suitable for measuring laser diodes and light emitting diodes on production lines.

In addition, it can be used to evaluate the transmission and loss characteristics of optical fibers and filters.

When used as a system component, the analyzer can be triggered, measured,

and output data in just 1.5 seconds, dramatically increasing system throughput.

Optical Measuring Instruments and Optical Device Test Systems

Optical Spectrum Analyzer for Coherent Measurements

■Coherence measurement

■High-speed measurements at 1.5 sec/scan

Wide wavelength range from 0.35 micron to 1.75 micron

■Wavelength measurement accuracy of 0.1 nm

The Q8344A is an optical spectrum analyzer with a wide wavelength range from 0.35 to 1.75 µm.

By using a Fourier spectroscopy system with a Michelson interferometer,

it is possible to analyze coherence that cannot be obtained with a dispersive spectroscopy system using a monochromator.

It demonstrates the ability to evaluate laser diodes for optical and video disks.

The Optical Measurement Instruments and Optical Devices Test System

has a built-in He-Ne laser used as a reference wavelength with a wavelength accuracy of ± 0.1 nm (1.3 µm),

which ensures long-term measurement stability even without wavelength calibration.

With a maximum wavelength resolution of 0.05 nm (0.85 µm), the Q8344A is suitable

for measuring laser diodes with narrow mode intervals.

Measurement speeds of about 1.5 seconds (0.4 to 1.05 µm and 0.8 to 1.75 µm)

are independent of the analysis span, so it can be used as a system component.

With its versatile display, analysis, and processing capabilities,

the Q8344A can be used for a variety of component characterization applications,

from light-emitting components such as laser diodes and LEDs to optical components such as optical fibers and filters.

High wavelength accuracy

Wavelength accuracy: ±0.01 nm (optional), ±0.05 nm (standard)

The Q8341’s built-in Ne-He laser reference light source enables spectral measurements with high wavelength accuracy.

Narrow-resolution measurement of the oscillation mode of a blue-violet laser diode

Wavelength resolution (at 650 nm):

0.01 nm (optional)

0.05 nm (standard)

The Q8341 has a narrow resolution that separates the oscillation modes of blue-violet laser diodes. In addition, the peak wavelength is measured with a resolution of 0.001 nm, making it ideal for monitoring measurement results affected by the DUT environment.

For high-throughput measurements

The Q8341 utilizes a large-capacity memory and a high-performance calculation unit to quickly store data. The calculation unit then performs calculations on this data to display the specified wavelength and span.

For example, if the Q8341 is to analyze spectra in two wavelength ranges (650 nm ±50 nm and 780 nm ±50 nm), it can perform spectral analysis of two different LDs by simply changing its display range.

All of this can be accomplished without reconfiguring the system. As a result, the Q8341 reduces the indexing time for mass production system use.

Measurement Principle

The Q8341 utilizes a Michelson interferometer. In this arrangement, light from the device under test is split into two paths (interference is generated between the two paths).

This produces an interferogram. The horizontal axis represents the difference in length (i.e., time or phase) of the two optical paths. And the vertical axis represents the intensity of the interfering light.

This is the autocorrelation of the device under test. FFT processing of this function yields the power spectrum. For this purpose, a He-Ne laser is used as a wavelength reference source.

Features

High-speed measurement option: 0.5 s.

Ideal for manufacturing/production environments The Q8341 can measure an entire span in approximately 0.5 seconds. This feature makes the Q8341 ideal for laser and LED production lines.

In addition, this fast measurement speed is ideal for high capacity environments.

Outstanding coherent analysis length

Analysis length Approx. 40 mm maximum (option)

Approx. 10 mm maximum (standard)

Maximum length resolution 0.001 mm

The Q8341 also evaluates the coherence of optical disk laser diodes. with an analysis length of up to 40 mm and a resolution as narrow as 0.001 mm, the Q8341 is ideally suited for evaluating blue-violet laser diodes and other compact optical components.

●High-speed, high-precision measurement LD

●High-speed measurement option: 0.5 s

●Narrow coherence measurement resolution: 0.001 mm

●Ten times higher wavelength accuracy: ±0.01 nm (option)

●High wavelength resolution option: 0.01 nm at 650 nm

Wide range of measurement wavelengths: 350 nm to 1000 nm

●Compact and lightweight platform

High throughput capability

The Q8341 is an optical spectrum analyzer for visible radiation with a wavelength range of 350 nm to 1000 nm.

The Q8341 utilizes a Fourier spectroscopy system with a Michelson interferometer so that coherence can be measured.

With a narrow wavelength resolution of 0.01 nm, the Q8341 is very effective in evaluating not only CD/DVD laser diodes, but also blue-violet laser diodes.

In addition, the built-in He-Ne laser serves as a wavelength reference, ensuring high wavelength measurement accuracy of ±0.01 nm.

Finally, the Q8341’s fast measurement speed of 0.5 seconds* makes it ideal for evaluating the temperature characteristics of system components.

Coherent measurement resolution: 0.001 mm

● Wavelength resolution (650 nm):

0.05 nm (standard), 0.01 nm (option)

Peak wavelength measurement resolution of 0.001 nm

● Wavelength measurement accuracy:

±0.05 nm (standard), ±0.01 nm (option)

●Maximum input level: ±10 dBm

●Maximum coherence measurement length:

Approx. 10 mm (standard), Approx. 40 mm (option)

●Wavelength measurement range 350 to 1000 nm

●Small size and light weight

Outstanding measurement performance

With a system dynamic range of up to 125 dB (typical), a greater range of RF components and modules can be measured.

With the world’s fastest measurement speed of 5 µs/point and 16 measurement channels,

the analyzer can be used for a wide range of applications, such as design,

evaluation, and front-end checkout of integrated multi-function modules.

Models with an upper operating frequency limit of 20 GHz

Despite the higher frequency of WLAN communications in the 5 GHz band and the high

standards of harmonics measurement in cellular phones,

there is a need for a larger measurement range to measure wider frequency bands.

The R3860A provides an application software package with an extended upper frequency limit of 20 GHz,

suitable for measuring devices that have reached demanding standards in recent years.

(The R3770 also operates from 300 kHz to 20 GHz).

Automated operation support and external device interfaces

The analyzer provides multiple interfaces to a variety of external instruments.

The front panel of the analyzer comes standard with mouse and keyboard connectors.

The rear panel has GPIB, LAN, printer ports, and VGA monitor output connectors.

In addition, the analyzer’s built-in parallel port allows control of automated equipment

without the need for an external controller,

providing two channels of 8-bit outputs and two channels of 4-bit inputs and outputs.

High-speed, high-precision high-frequency measurements

The R3860A RF component analyzer and the R3768/3770 network analyzers use our original analog

technology and high-speed operating algorithms to achieve a system dynamic range of 125 dB (typical).

The measurement performance of these analyzers easily reaches the level of measurements required for

filters designed for cell phone base stations, enabling high dynamic range measurements to be performed at high speed.

In addition, the R3860A and R3768/3770 set a precedent for improved total throughput,

since even the choice of a broadband RBW filter ensures a wide dynamic range for high-speed measurements.

Trace noise is also reduced to half that of previous ADVANTEST products.

In addition, other features of the ADVANTEST analyzer have been enhanced for high-speed, stable measurements.

ADVANTEST has introduced a new generation of analyzers with the flexibility to handle

all tasks requiring extremely high accuracy, high speed measurements and superior analysis capabilities.

The R3860A RF Component Analyzer is a new generation of analyzers that provides

the flexibility to measure RF modules with a wide range of functions.

Its flexibility covers a wide range of uses from RF modules combining multiple functions

to frequency conversion circuits and other active components.

The R3768/3770 network analyzers are high-performance,

multi-port analyzers designed with an increased focus on measuring passive components.

Higher frequencies are also supported, with the R3680A*1/3768 supporting frequencies

from 300 kHz to 8 GHz and the R3770 supporting frequencies from 300 kHz to 20 GHz.

All models feature software fixturing that enables real-time simulation of virtual matching circuits

and normalized impedance conversion in addition to S-parameter analysis.

With the world’s fastest high-speed scanning speed of 5 µs/point,

even complex analysis simulations can be completed immediately.

In addition, the multiport models enable software balance simulation and balance parameter analysis.

When used in conjunction with the flexible multi-window and multi-trace capabilities,

these models also allow for instant measurement of complex analytical projects.

The large, high-visibility display is a key factor in improving analysis efficiency,

as it simultaneously displays multi-port paths in addition to fixture simulation traces.