Archives

High Sensitivity Sensors

Noise level: -94 dBm.

The Q82208 and Q82232 optical sensors achieve high sensitivity by cooling the InGaAs photodiode.

the Q82208. in particular, achieves -94 dBm. all three types are capable of measuring high power up to

+10 dBm with high linearity.

These sensors meet a wide range of user requirements for polarization correlation, return loss, and sensor

type.

They meet a wide range of measurement requirements.

High Power Input Optical Sensors (Q82227)

Maximum input power: +27 dBmThe Q82227 is suitable for long wavelength, high sensitivity and high

power light.

The sensor is capable of measuring optical inputs up to +27 dBm.

Therefore, it is suitable for measuring the output of fiber-optic amplifiers, pump sources for fiber-optic

amplifiers,and high-output devices (e.g., LDs for optical CATV).

In addition, the Q82227 has a noise level of -80 dBm, so it can be used for measurements requiring a

wide dynamic range.

Trend Monitoring Function

Input power and wavelength can be displayed as a digital readout, as well as a time-domain trend graph.

Printer and floppy disk drive are standard The system is equipped

with a high-speed thermal printer capable of reproducing the display in less than 8 seconds.

In addition, the system is equipped with a floppy disk drive using MS-DOS for easy data storage and

analysis.

In addition, data is stored in text format for easy analysis and processing on a personal computer. In

addition, the stored data can be subsequently scaled.

Displayable optical frequency

In addition to the normal wavelength display mode, the measurement spectrum can also display the

optical frequency.

Since light in terahertz units can be read directly, this is useful for measuring optical wavelength

division multiplexing and chirping from LDs, as well as for analyzing Soliton transmission systems.

Coherence analysis of ±165 mm

Because the Q8347 uses a Michelson interferometer, the system is capable of performing coherence

analysis.

This feature makes it easy to evaluate the noise rejection performance of a disc LD. In addition,

the travel of the interferometer can be greatly increased to allow analysis over a range of ±165 mm.

As a result, more detailed analysis can be performed in addition to the conventional secondary maximum

peak (α value).

Curve fitting function

The Q8347 offers sech2 and Gaussian function curve fitting. Therefore, it can be used for spectral analysis

of soliton transmission systems.

List display

The peaks of spectrum or coherence data can be displayed as digital data containing up to 200 points.

The separation and level of each channel of an optical WDM transmission system can be seen at a glance.

Displayable optical frequency

In addition to the normal wavelength display mode, the measurement spectrum can also display the

optical frequency.

Since light in terahertz units can be read directly, this is useful for measuring optical wavelength

division multiplexing and chirping from LDs, as well as for analyzing Soliton transmission systems.

Coherence analysis of ±165 mm

Because the Q8347 uses a Michelson interferometer, the system is capable of performing coherence

analysis.

This feature makes it easy to evaluate the noise rejection performance of a disc LD. In addition,

the travel of the interferometer can be greatly increased to allow analysis over a range of ±165 mm.

As a result, more detailed analysis can be performed in addition to the conventional secondary maximum

peak (α value).

Curve fitting function

The Q8347 offers sech2 and Gaussian function curve fitting. Therefore, it can be used for spectral analysis

of soliton transmission systems.

High-speed measurement

Measurement time Approx. 6.7 ms (per measurement point) Approx. 4 seconds (within the specified span)

The interval between scans (measurement time) is approx. 4 seconds.

This means that the Q7750 can complete a measurement in 4 seconds,

whereas the previous measurement process took several tens of seconds.

If the measurement time is too long, accurate results may not be obtained because

the characteristics of the device under test may change due to environmental conditions such as

temperature.

The Q7750 completes measurements in a short period of time, ensuring high-speed,

accurate measurements that are unaffected by the temperature characteristics of the device under test.

The Q7750 has a maximum optical frequency resolution of 50 MHz,

which enables measurements in the field of ultra-high-resolution optical carrier frequencies that were not

previously possible.

Amplitude and chromatic dispersion characteristics of optical devices

for DenseWDM or Ultra-Dense-WDM can be easily measured (channel steps: 100 GHz, 50 GHz, 25 GHz,

etc.).

Selectable wavelength spans from 70 nm (maximum) to approximately 0.1 nm (minimum).

High optical frequency resolution

Optical frequency resolution: up to 50 MHz (converted to 0.4 pm according to wavelength)

The Q7750 has a maximum optical frequency resolution of 50 MHz,

which enables measurements in the field of ultra-high-resolution optical carrier frequencies that were not

previously possible.

Amplitude and chromatic dispersion characteristics of optical devices

for DenseWDM or Ultra-Dense-WDM can be easily measured (channel steps: 100 GHz, 50 GHz, 25 GHz,

etc.).

Selectable wavelength spans from 70 nm (maximum) to approximately 0.1 nm (minimum).

High-speed measurement

Measurement time Approx. 6.7 ms (per measurement point) Approx. 4 seconds (within the specified span)

The interval between scans (measurement time) is approx. 4 seconds.

This means that the Q7750 can complete a measurement in 4 seconds,

whereas the previous measurement process took several tens of seconds.

If the measurement time is too long, accurate results may not be obtained because

the characteristics of the device under test may change due to environmental conditions such as

temperature.

The Q7750 completes measurements in a short period of time, ensuring high-speed,

accurate measurements that are unaffected by the temperature characteristics of the device under test.

Key Features

– Sensitivity -92 dBm

– Polarization correlation ±0.05 dB

– Resolution bandwidth accuracy ±2

– Power Measurement

– Pulsed light measurement

Operation

In addition to amplifier analysis, a variety of display modes are available, such as

– Overlay display,

– Comparison with memory contents,

– Display of two independent graphs (split screen),

– Power meter function,

– Use of multiple markers,

– Normalized and direct readout of transmission loss and

– Automatic bandwidth analysis (e.g. measurement of half-value widths based on RMS and envelope

methods),

– Curve fitting over the IEC/IEEE bus and many other features facilitate operation of the analyzer and

simplify analysis.

A standard internal disk drive is used as a storage medium.

Stored binary data can be analyzed with the appropriate program under MS-Windows or copied to a file

and printed out.

The high-speed built-in thermal printer prints out a hard copy of the measurement results with all setup

parameters in less than 10 seconds.

The built-in high-speed thermal printer prints a hard copy of the measurement results with all setup

parameters in less than 8 seconds.