Generates SDH/SONET Frame Patterns Close to Actual Data

For evaluating optical transport equipment, E/O and O/E modules

Frame-level testing is required for O/OE and E/O testing of SDH/SONET systems.

The D3186 Pulse Pattern Generator, in addition to having a large WORD memory

of 8 M bits in length, provides a frame-level test in the STM frame header section.

The D3186 Pulse Pattern Generator, in addition to having a large 8 M-bit WORD memory,

provides the optional functions of inserting a WORD pattern into the header portion

of the STM frame and inserting an arbitrary PRBS into the payload portion,

thus realizing a test pattern that is very close to the actual data.

Of course, the D3286 error detector can measure errors in the header and payload sections separately.

In addition, the D3286 has a frame synchronization function and a specific area error

measurement function, which can effectively support the location of the cause of the error.